Ruolo editoriale nella rivista «IEEE Transactions on Computers»
Ruolo editoriale nella rivista «IEEE Transactions on Emerging Topics in Computing»
Ruolo editoriale nella rivista «Journal of Electronic Testing: Theory and Applications (JETTA)»
Grossi, Marco; Omana, Martin; Metra, Cecilia, Impact of aging on temperature measurements performed using a resistive temperature sensor with sensor-to-microcontroller direct interface, «MICROELECTRONICS RELIABILITY», 2025, 169, Article number: 115729, pp. 1 - 11 [articolo]
Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea, Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays, «IEEE ACCESS», 2025, 13, Article number: 10942602, pp. 55970 - 55983 [articolo]Open Access
Grossi, Marco; Manoni, Simone; Parisi, Emanuele; Omana, Martin; Metra, Cecilia; Alfonsi, Fabrizio; Gabrielli, Alessandro; Acquaviva, Andrea, A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors, in: The 8th International Conference on System Reliability and Safety (ICSRS 2024), 2024, pp. 1 - 6 (atti di: International Conference on System Reliability and Safety, Catania (Sicily), November 20-22, 2024) [Contributo in Atti di convegno]
Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea, A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices, «ENGINEERING PROCEEDINGS», 2024, 82, pp. 1 - 9 [articolo]
Omana, M.; Cantagallo, F.; Finelli, F.; Metra, C., AI for Cyberattacks’ Detection in the Metaverse, in: Proceedings of the IEEE International Symposium on the Emerging Metaverse (ISEMV 2024), 2024, pp. 1 - 4 (atti di: IEEE International Symposium on the Emerging Metaverse (ISEMV 2024), Bellevue, Seattle (WA), 21 Ottobre 2024) [Contributo in Atti di convegno]
Omana, M.; Grossi, M.; Rossi, D.; Metra, C., Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs), «MICROELECTRONICS RELIABILITY», 2024, 162, Article number: 115520, pp. 1 - 10 [articolo]
M. Zhupa, M. Naldi, M. Omana, C. Metra, On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024(atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, 3-5 July 2024) [atti di convegno-poster]
Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli, Reliability of AI in Predicting the State of Health of Li-Ion Batteries, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024, pp. 1 - 7 (atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, 3-5 July 2024) [Contributo in Atti di convegno]
M. Omana; A. Manfredi; C. Metra; R. Locatelli; M. Chiavacci; S. Petrucci, Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Piscataway, New Jersey, Institute of Electrical and Electronics Engineers (IEEE), «PROCEEDINGS (IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM. ONLINE)», 2024, pp. 1 - 6 (atti di: 30th International Symposium on On - line Testing and Robust System Design (IOLTS 2024), Rennes, France, 3-5 July 2024) [Contributo in Atti di convegno]
William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Martin Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser, RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters, in: Proceedings of the 22nd International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS), Springer, 2023, pp. 395 - 410 (atti di: 23rd International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS), SAMOS, 2-6 July 2023) [Contributo in Atti di convegno]
Martin Omana, Marco Grossi, Cecilia Metra, Early detection of photovoltaic system inverter faults, «MICROELECTRONICS RELIABILITY», 2022, 135, Article number: 114594, pp. 1 - 13 [articolo]Open Access
F. Finelli; M. Omana; C. Metra, Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection, in: 23rd Latin American Test Symposium (LATS 2022), 2022, pp. 1 - 6 (atti di: 23rd IEEE Latin American Test Symposium (LATS), Montevideo, Uruguay (evento virtuale), 5-8 Settembre 2022) [Contributo in Atti di convegno]Open Access
