D. Rossi; A. Muccio; A. K. Nieuwand; A. Katoch; C. Metra, Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems, in: Proceedings 10th IEEE International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, R. Leveugle, M. Nicolaidis, J. Texeira, 2004, pp. 135 - 140 (atti di: 10th IEEE International On-Line Testing Symposium, Madeira, Portugal, 12-14 luglio 2004) [Contributo in Atti di convegno]
METRA C.; S. DI FRANCESCANTONIO; TM. MAK, Implications of Clock Distribution Faults and Issues with Screening Them During Manufacturing Testing, «IEEE TRANSACTIONS ON COMPUTERS», 2004, 53, No. 5, pp. 531 - 546 [articolo]
C. Metra ; M. Sonza Reorda, Journal of Electronic Testing, S.L., C. Metra , M. Sonza Reorda, 2004, pp. 459 -567 (Special Issue on Special Issue on On-Line-Testing). [libro]
M. Omaña; D. Rossi; C. Metra, Low Cost Scheme for On-Line Skew Compensation, in: Proceedings 23rd IEEE VLSI Test symposium, LOS ALAMITOS, s.n, 2004, pp. 90 - 95 (atti di: 23rd IEEE VLSI Test symposium, Palm Spriings, CA, USA, 1-5 Maggio 2005) [Contributo in Atti di convegno]
J. M. Cazeaux; M. Omaña; C. Metra, Low-Area On-Chip Circuit for Jitter Measurement in a Phase-Locked Loop, in: Proceedings 10th IEEE International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira, 2004, pp. 17 - 22 (atti di: 10th IEEE International On-Line Testing Symposium, Madeira, Portugal, 12-14 luglio 2004) [Contributo in Atti di convegno]
M. Omaña; D. Rossi; C. Metra, Model for Transient Fault Susceptibility of Combinational Circuits, «JOURNAL OF ELECTRONIC TESTING», 2004, 20, pp. 501 - 509 [articolo]
J. M. Cazeaux; D. Rossi; C. Metra, New High Speed CMOS Self-Checking Voter, in: Proceedings 10th IEEE International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira, 2004, pp. 58 - 63 (atti di: 10th IEEE International On-Line Testing Symposium, Madeira, Portugal, 12-14 luglio 2004) [Contributo in Atti di convegno]
C. Metra; R. Leveugle; M. Nicolaidis; J. Teixeira, Proceedings 10th IEEE International On-Line Testing Symposium, LOS ALAMITOS, IEEE, 2004, pp. v - 244 . [curatela]
C. Metra; T. M. Mak; M. Omaña, Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing, in: International Test Conference 2004 Proceedings, LOS ALAMITOS, s.n, 2004, pp. 1223 - 1231 (atti di: International Test Conference 2004, Charlotte, NC, USA, 26-28 Ottobre 2004) [Contributo in Atti di convegno]
C. Metra; T. M. Mak; M. Omaña, Should We Make Our Design for Testability Schemes Fault Secure ?, in: Proceedings IEEE European Test Symposium, LOS ALAMITOS, IEEE, 2004, pp. 67 - 72 (atti di: IEEE European Test Symposium, Aiaccio, France, May 23-26, 2004) [Contributo in Atti di convegno]
M. Favalli; C. Metra, TMR voting in the presence of crosstalk faults at the voter inputs, «IEEE TRANSACTIONS ON RELIABILITY», 2004, 53, pp. 342 - 348 [articolo]
C. Metra; R. Leveugle; M. Nicolaidis; J. Teixeira, Welcome Message, in: C. METRA R. LEVEUGLE M. NICOLAIDIS J. TEIXEIRA, Proceedings 10th IEEE International On-Line Testing Symposium., LOS ALAMITOS, C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira, 2004, pp. x - x [introduzione]
