M. Omana; D. Rossi; N. Bosio; C. Metra, Low Cost NBTI Degradation Detection and Masking Approaches, «IEEE TRANSACTIONS ON COMPUTERS», 2013, 62, pp. 496 - 509 [articolo]
M. Omaña; D. Rossi; F. Fuzzi; C. Metra; C. Tirumurti; R. Galivanche, Novel Approach to Reduce Power Droop During Scan-Based Logic BIST, in: Proceedings of the 18th IEEE European Test Symposium, Los Alamitos, IEEE Computer Society, 2013, pp. 1 - 6 (atti di: 18th IEEE European Test Symposium, Avignon, France, 27-31 maggio 2013) [Contributo in Atti di convegno]
R. Vimalathithan; D. Rossi; M. Omaña; C. Metra; M.L.Valarmathi, Polynomial Based Key Distribution Scheme for WPAN, «MALAYSIAN JOURNAL OF MATHEMATICAL SCIENCES», 2013, 7, pp. 59 - 72 [articolo]
M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi, Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection, in: Proceedings of 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, LOS ALAMITOS, IEEE Computer Society, 2012, pp. 199 - 204 (atti di: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Austin (TX), United States, 3-5 ottobre 2012) [Contributo in Atti di convegno]
C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D. Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella, High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies, in: Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, LOS ALAMITOS, IEEE Computer Society, 2012, pp. 121 - 125 (atti di: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Austin, Texas, U.S.A., 3-5 ottobre 2012) [Contributo in Atti di convegno]
Ruolo editoriale nella rivista «IEEE Transactions on Computers»
C. Metra; M. Omaña; TM Mak; S. Tam, New Design For Testability Approach for Clock Fault Testing, «IEEE TRANSACTIONS ON COMPUTERS», 2012, 61, pp. 448 - 457 [articolo]
Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi, Polynomial Based Key Distribution Scheme for WPAN, in: Proceedings of 3rd International Conference on Cryptology and Computer Security 2012, PENANG, s.n, 2012, pp. 178 - 183 (atti di: 3rd International Conference on Cryptology and Computer Security 2012, Langkawi, Malaysia., 4-6 giugno 2012) [Contributo in Atti di convegno]
D. Rossi; N. Timoncini; M. Spica; C. Metra, Error correcting code analysis for cache memory high reliability and performance, in: Proceedings Design, Automation and Test in Europe Conference and Exhibition, LOS ALAMITOS, B. M. Al-Hashimi, E. Macii, 2011, pp. 1 - 6 (atti di: Design, Automation and Test in Europe Conference and Exhibition (DATE 2011), Grenoble, France, 14-18 marzo 2011) [Contributo in Atti di convegno]
C. Metra; C. Thibeault, Foreword, in: Proceedings of 29th IEEE VLSI Test Symposium, LOS ALAMITOS, C. Metra, C. Thibeault, 2011, pp. ix - ix [introduzione]
C. Metra; R. Galivanche, Guest Editors' Introduction: Special Section on Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems, in: C. METRA R. GALIVANCHE, IEEE TRANSACTIONS ON COMPUTERS, LOS ALAMITOS, C. Metra, R. Galivanche, 2011, pp. 1217 - 1218 [introduzione]
D. Rossi; M. Omaña; C. Metra; A. Paccagnella, Impact of Aging Phenomena on Soft Error Susceptibility, in: Proceedings of 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, LOS ALAMITOS, P. Joshi, M. Violante, G. Chapman, F. Salice, 2011, pp. 18 - 24 (atti di: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Vancouver (B.C.), Canada, 3-5 October 2011) [Contributo in Atti di convegno]
M. Omaña; C. Metra; T. M. Mak; S. Tam, Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2011, 19, pp. 2322 - 2325 [articolo]
D. Giaffreda; M. Omaña; D. Rossi; C. Metra, Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition, in: Proceedings of 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, LOS ALAMITOS, P. Joshi, M. Violante, G. Chapman, F. Salice, 2011, pp. 252 - 258 (atti di: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Vancouver (B.C.), Canada, 3-5 ottobre 2011) [Contributo in Atti di convegno]
M. Omaña; D. Rossi; C. Metra, High-Performance Robust Latches, «IEEE TRANSACTIONS ON COMPUTERS», 2010, 59, pp. 1455 - 1465 [articolo]
