Foto del docente

Maurizio Millesimo

Research fellow

"Ercole De Castro" Research Centre on Electronic Systems for Information and Communication Technologies

Teaching tutor

Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"

Publications

Millesimo, M.; Fiegna, C.; Bakeroot, B.; Borga, M.; Posthuma, N.; Decoutere, S.; Sangiorgi, E.; Tallarico, A. N., Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate, in: IEEE International Reliability Physics Symposium Proceedings, New York, Institute of Electrical and Electronics Engineers Inc., 2024, 5, pp. 1 - 6 (atti di: 2024 IEEE International Reliability Physics Symposium, IRPS 2024, USA, 14-18 of april 2024) [Contribution to conference proceedings]Open Access

Ercolano, F.; Tallarico, A. N.; Millesimo, M.; Gnani, E.; Reggiani, S.; Fiegna, C.; Borga, M.; Posthuma, N.; Bakeroot, B., GaN HEMT with p-Type Schottky Gate: A Case Study of TCAD Modeling of the Gate Leakage Current, in: Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society, Springer Science and Business Media Deutschland GmbH, 2024, 1113, pp. 288 - 297 (atti di: 54th Annual Meeting of the Italian Electronics Society, SIE 2023, Noto (SR), Italy, 6/8 September 2023) [Contribution to conference proceedings]

Tallarico A.N.; Millesimo M.; Borga M.; Bakeroot B.; Posthuma N.; Cosnier T.; Decoutere S.; Sangiorgi E.; Fiegna C., P-GaN Gate HEMTs: A Solution to Improve the High-Temperature Gate Lifetime, «IEEE ELECTRON DEVICE LETTERS», 2024, 45, Article number: 10587301 , pp. 1630 - 1633 [Scientific article]Open Access

Millesimo M.; Borga M.; Valentini L.; Bakeroot B.; Posthuma N.; Vohra A.; Decoutere S.; Fiegna C.; Tallarico A.N., Role of the GaN-on-Si Epi-Stack on Δ RONCaused by Back-Gating Stress, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2023, 70, Article number: 10225455 , pp. 5203 - 5209 [Scientific article]Open Access

Millesimo, M.; Bakeroot, B.; Borga, M.; Posthuma, N.; Decoutere, S.; Sangiorgi, E.; Fiegna, C.; Tallarico, A. N., Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition, in: IEEE International Reliability Physics Symposium Proceedings, Institute of Electrical and Electronics Engineers Inc., 2022, 2022-, pp. 10B.2-1 - 10B.2-6 (atti di: 2022 IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 2022) [Contribution to conference proceedings]Open Access

Tallarico A.N.; Millesimo M.; Bakeroot B.; Borga M.; Posthuma N.; Decoutere S.; Sangiorgi E.; Fiegna C., TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2022, 69, pp. 507 - 513 [Scientific article]Open Access

Millesimo, M.; Borga, M.; Bakeroot, B.; Posthuma, N.; Decoutere, S.; Sangiorgi, E.; Fiegna, C.; Tallarico, A. N., The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs, «IEEE ELECTRON DEVICE LETTERS», 2022, 43, pp. 1846 - 1849 [Scientific article]Open Access

Millesimo M.; Fiegna C.; Posthuma N.; Borga M.; Bakeroot B.; Decoutere S.; Tallarico A.N., High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2021, 68, Article number: 9540042 , pp. 5701 - 5706 [Scientific article]Open Access

Millesimo M.; Posthuma N.; Bakeroot B.; Borga M.; Decoutere S.; Tallarico A.N., Impact of structural and process variations on the time-dependent off-state breakdown of p-gan power hemts, «IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY», 2021, 21, Article number: 9311207 , pp. 57 - 63 [Scientific article]Open Access

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