Martin Omana, Marco Grossi, Cecilia Metra, Early detection of photovoltaic system inverter faults, «MICROELECTRONICS RELIABILITY», 2022, 135, Article number: 114594, pp. 1 - 13 [articolo]Open Access
F. Finelli; M. Omana; C. Metra, Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection, in: 23rd Latin American Test Symposium (LATS 2022), 2022, pp. 1 - 6 (atti di: 23rd IEEE Latin American Test Symposium (LATS), Montevideo, Uruguay (evento virtuale), 5-8 Settembre 2022) [Contributo in Atti di convegno]Open Access
M. Grossi, M. Bouras, M. Omana, H. Berbia, Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs, «MICROPROCESSORS AND MICROSYSTEMS», 2022, 89, Article number: 104437, pp. 1 - 9 [articolo]Open Access
Grossi, Marco; Omana, Martin; Rossi, Daniele; Marzulli, Biagio; Metra, Cecilia, Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function, in: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2022, pp. 1 - 7 (atti di: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino, Italia, 12-14 Settembre 2022) [Contributo in Atti di convegno]
Omana M.E.; Bardhan S.; Metra C., Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2022, 10, Article number: 9557806, pp. 2086 - 2091 [articolo]Open Access
Grossi M.; Omana M., Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers, «JOURNAL OF ELECTRONIC TESTING», 2021, 37, pp. 533 - 544 [articolo]Open Access
Shirmohammadi Z.; Khorami A.; Omana M.E., ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system, «THE JOURNAL OF SUPERCOMPUTING», 2021, 77, pp. 6692 - 6713 [articolo]Open Access
Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra, Fault-Tolerant Inverters for Reliable Photovoltaic Systems, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2019, 27, pp. 20 - 28 [articolo]
M. Grossi, M. Omaña, Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers, «JOURNAL OF ELECTRONIC TESTING», 2019, 35, pp. 261 - 267 [articolo]
M. Omaña, S. Govindara, C. Metra, Low-Cost Strategy for Bus Propagation Delay Reduction, «JOURNAL OF ELECTRONIC TESTING», 2019, 35, pp. 253 - 260 [articolo]
Grossi M.; Berardinelli A.; Sazonov E.; Beccaro W.; Omana M., Recensione a: Sensors and embedded systems in agriculture and food analysis, «JOURNAL OF SENSORS», 2019, 2019, pp. 1 - 2 [recensione]Open Access
Martin Omana; Tusharasandeep Edara; Cecilia Metra, Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2018, 6, pp. 488 - 497 [articolo]
Martin, Omana; Marco, Padovani; Kreshnik, Veliu; Cecilia, Metra; Juergen, Alt; Rajesh, Galivanche, New Approaches for Power Binning of High Performance Microprocessors, «IEEE TRANSACTIONS ON COMPUTERS», 2017, 66, pp. 1159 - 1171 [articolo]
Omaña, Martin; Rossi, Daniele; Fuzzi, Filippo; Metra, Cecilia; Tirumurti, Chandrasekharan Chandra; Galivanche, Rajesh, Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2017, 25, pp. 238 - 246 [articolo]
Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia, Impact of Aging Phenomena on Latches’ Robustness, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2016, 15, pp. 129 - 136 [articolo]
