Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia, Impact of Aging Phenomena on Latches’ Robustness, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2016, 15, pp. 129 - 136 [Scientific article]
Omana, M.; Fiore, A.; Metra, C., Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems, in: Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016, 2016, pp. 672 - 677 (atti di: Design, Automation and Test in Europe Conference and Exhibition, DATE, Dresden, Germany, 14-18 Marzo 2016) [Contribution to conference proceedings]
Omaña, M.; Rossi, D.; Beniamino, E.; Metra, C.; Tirumurti, C.; Galivanche, R., Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST, «IEEE TRANSACTIONS ON COMPUTERS», 2016, 65, pp. 2484 - 2494 [Scientific article]
Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L., Cryptanalysis of Simplified-AES Encrypted Communication, «INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY», 2015, 13, pp. 142 - 150 [Scientific article]
D. Rossi; M. Omaña; C. Metra; A. Paccagnella, Impact of Bias Temperature Instability on Soft Error Susceptibility, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 743 - 751 [Scientific article]
Kochte, Michael A.; Dalirsani, Atefe; Bernabei, Andrea; Omana, Martin; Metra, Cecilia; Wunderlich, Hans-Joachim, Intermittent and Transient Fault Diagnosis on Sparse Code Signatures, in: Proceedings of the Asian Test Symposium, IEEE Computer Society, 2015, 2016-, pp. 157 - 162 (atti di: 24th IEEE Asian Test Symposium, ATS 2015, ind, 2015) [Contribution to conference proceedings]
M. Omaña; D. Rossi; D. Giaffreda; C. Metra; TM Mak; A. Rahman; S. Tam, Low-Cost On-Chip Clock Jitter Measurement Scheme, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 435 - 443 [Scientific article]
Rossi, Daniele; Omana, Martin; Giaffreda, Daniele; Metra, Cecilia, Modeling and Detection of Hotspot in Shaded Photovoltaic Cells, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 1031 - 1039 [Scientific article]
Ruolo editoriale nella rivista «ACM Transactions on Design Automation of Electronic Systems»
D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak, Clock Faults Induced Min and Max Delay Violations, «JOURNAL OF ELECTRONIC TESTING», 2014, 30, pp. 111 - 123 [Scientific article]
Ruolo editoriale nella rivista «International Journal of Highly Reliable Electronic Systems»
Ruolo editoriale nella rivista «Journal of Electronic Testing: Theory and Applications (JETTA)»
M. Omaña; D. Rossi; E. Beniamino; C. Metra; C. Tirumurti; R. Galivanche, Power droop reduction during Launch-On-Shift scan-based logic BIST, in: The 27th IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014, pp. 21 - 26 (atti di: Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), Amsterdam, Olanda, October 1-3, 2014) [Contribution to conference proceedings]
Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B., Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2013, 21, pp. 2286 - 2294 [Scientific article]
D. Rossi; M. Omaña; G. Garrammone; C. Metra; A. Jas; and R. Galivanche, Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder, «JOURNAL OF ELECTRONIC TESTING», 2013, 29, pp. 401 - 413 [Scientific article]
