A. Santarelli;D. Niessen;R. Cignani;G. P. Gibiino;P. A. Traverso;C. Florian;D. Schreurs;F. Filicori, Large-signal GaN transistor characterization and modeling including charge trapping nonlinear dynamics, in: Proceedings of 2014 IEEE MTT-S International Microwave Symposium (IMS2014), 2014, pp. 1 - 3 (atti di: 2014 IEEE MTT-S International Microwave Symposium (IMS2014), Tampa (FL) USA, 1-6 June, 2014) [Contribution to conference proceedings]
P. Magnone; P. A. Traverso; C. Fiegna, Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Device, in: 19th Symposium IMEKO, 2014, pp. 1046 - 1051 (atti di: 19th Symposium IMEKO, Benevento, September 15 - 17, 2014) [Contribution to conference proceedings]
P. Magnone;G. Barletta;P.A. Traverso;A. Magri;E. Sangiorgi;C. Fiegna, Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), in: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), Institute of Electrical and Electronics Engineers Inc., 2014, pp. 163 - 166 (atti di: International Symposium on Power Semiconductor Devices and ICs, Waikoloa, HI, 15-19 June 2014) [Contribution to conference proceedings]
Corrado Florian;Pier Andrea Traverso;Alberto Santarelli;Fabio Filicori, An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices, «IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT», 2013, 62, pp. 2857 - 2869 [Scientific article]
Paolo Magnone; Pier Andrea Traverso; Giacomo Barletta; Claudio Fiegna, Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide, in: 19 th Symposium IMEKO TC 4 Symposium and 17th IWADC Workshop Advances in Instrumentation and Sensors Interoperability, 2013, pp. 240 - 245 (atti di: 19 th Symposium IMEKO TC 4 Symposium and 17th IWADC Workshop Advances in Instrumentation and Sensors Interoperability, Barcelona, Spain, July 18-19, 2013) [Contribution to conference proceedings]
A. Santarelli;R. Cignani;G. b. Gibiino;D. Niessen;P. Traverso;C. Florian;C. Lanzieri;A. Nanni;D. Schreurs;F. Filicori, Nonlinear charge trapping effects on pulsed I/V characteristics of GaN FETs, in: Proceedings of 43rd European Microwave Conference, EuMC 2013, Nuremberg, 2013, pp. 1375 - 1378 (atti di: 43rd European Microwave Conference, EuMC 2013, Nuremberg, 2013) [Contribution to conference proceedings]
A. Santarelli;R. Cignani;G.P. Gibiino;D. Niessen;P.A. Traverso;C. Florian;C. Lanzieri;A. Nanni;D. Schreurs;F. Filicori, Nonlinear charge trapping effects on pulsed I/V characteristics of GaN FETs, in: Proceedings of the 8th European Microwave Integrated Circuits Conference, EuMIC 2013, London, HORIZON HOUSE PUBLICATIONS INC, 2013, pp. 404 - 407 (atti di: European Microwave Integrated Circuits Conference, EuMIC 2013, Nuremberg, 2013) [Contribution to conference proceedings]
Alberto Santarelli;Rafael Cignani;Daniel Niessen;Pier Andrea Traverso;Fabio Filicori, New pulsed measurement setup for GaN and GaAs FETs characterization, «INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES», 2012, 4, pp. 387 - 397 [Scientific article]
P.A. Traverso; M. Salami; G. Pasini; F. Filicori, Non-linear dynamic modelling of broad-band GHz-field Analogue-to-Digital acquisition channels, «MEASUREMENT», 2012, 45, pp. 2529 - 2538 [Scientific article]
A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori, A Dual-Source Nonlinear Measurement System Oriented to the Empirical Characterization of Low-Frequency Dispersion in Microwave Electron Devices, «COMPUTER STANDARDS & INTERFACES», 2011, 33, pp. 165 - 175 [Scientific article]
P.A. Traverso; M. Salami; G. Pasini; F. Filicori, Characterization and modelling of broad-band GHz-field A/D acquisition channels by means of the Discrete-Time Convolution Model behavioural approach, in: Proceedings of IMEKO TC-4 2011 Inter. Workshop on ADC Modelling, Testing and Data Converter Analysis and Design and IEEE 2011 ADC Forum, ORVIETO, IMEKO TC-4, 2011, pp. 211 - 216 (atti di: IMEKO TC-4 2011 Inter. Workshop on ADC Modelling, Testing and Data Converter Analysis and Design and IEEE 2011 ADC Forum, Orvieto, Italy, June 2011) [Contribution to conference proceedings]
A. Santarelli;R. Cignani;D. Niessen;S. D'Angelo;P. Traverso;F. Filicori, Characterization of GaN and GaAs FETs through a new pulsed measurement system, in: Proceedings of the 6th European Microwave Integrated Circuits Conference, 16 Sussex Street, London, SW1V 4RW, UK, HORIZON HOUSE PUBLICATIONS INC, 2011, pp. 1 - 4 (atti di: 14th European Microwave Week 2011: "Wave to the Future", EuMW 2011 - 6th European Microwave Integrated Circuit Conference, EuMIC 2011, Manchester, United Kingdom, 10-11 Oct. 2011) [Contribution to conference proceedings]
C. Florian; P.A. Traverso; F. Filicori, The Charge-Controlled Nonlinear Noise Modeling Approach for the Design of MMIC GaAs-pHEMT VCOs for Space Applications, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2011, 59, pp. 901 - 912 [Scientific article]
C. Florian; P.A. Traverso; M. Feudale; F. Filicori, A C-band GaAs-pHEMT MMIC low phase noise VCO for space applications using a new cyclostationary nonlinear noise model, in: 2010 IEEE MTT-S International Microwave Symposium Digest, s.l, IEEE-MTT, 2010, pp. 284 - 287 (atti di: 2010 IEEE MTT-S International Microwave Symposium, Anaheim, CA - USA, 23-28 Maggio 2010) [Contribution to conference proceedings]
C. Florian; P.A. Traverso, A set-up with load- and source-pull capabilities for phase noise and frequency stability characterization of microwave devices under oscillating operation, in: IEEE MT-T INTERNATIONAL, IEEE MTT-S International Microwave Symposium Digest, 2009. MTT '09., s.l, s.n, 2009, pp. 1205 - 1208 (atti di: IEEE MTT-S International Microwave Symposium - IMS2009, Boston, MA - USA, 7-12 Giugno 2009) [Contribution to conference proceedings]
