Di Mauro A.; Rossi D.; Pullini A.; Flatresse P.; Benini L., Performance-aware predictive-model-based on-chip body-bias regulation strategy for an ULP multi-core cluster in 28 nm UTBB FD-SOI, «INTEGRATION», 2020, 72, pp. 194 - 207 [articolo]Open Access
Garofalo A.; Rusci M.; Conti F.; Rossi D.; Benini L., PULP-NN: Accelerating Quantized Neural Networks on Parallel Ultra-Low-Power RISC-V Processors, «PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A: MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES», 2020, 378, Article number: 20190155, pp. 1 - 22 [articolo]Open Access
Pittino F.; Diversi R.; Benini L.; Bartolini A., Robust identification of thermal models for in-production High-Performance-Computing clusters with machine learning-based data selection, «IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS», 2020, 39, Article number: 8887210, pp. 2042 - 2054 [articolo]Open Access
Zanghieri, Marcello; Benatti, Simone; Burrello, Alessio; Kartsch, Victor; Conti, Francesco; Benini, Luca, Robust Real-Time Embedded EMG Recognition Framework Using Temporal Convolutional Networks on a Multicore IoT Processor, «IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS», 2020, 14, pp. 244 - 256 [articolo]Open Access
Mayer P.; Magno M.; Berger A.; Benini L., RTK-LoRa: High-Precision, Long-Range and Energy-Efficient Localization for Mobile IoT devices, in: 2020 IEEE Sensors Applications Symposium, SAS 2020 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 1 - 5 (atti di: 15th IEEE Sensors Applications Symposium, SAS 2020, mys, 2020) [Contributo in Atti di convegno]
Cerutti G.; Andri R.; Cavigelli L.; Farella E.; Magno M.; Benini L., Sound event detection with binary neural networks on tightly power-constrained IoT devices, in: ACM International Conference Proceeding Series, Association for Computing Machinery, 2020, pp. 19 - 24 (atti di: 2020 ACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2020, usa, 2020) [Contributo in Atti di convegno]
Zanghieri M.; Benatti S.; Conti F.; Burrello A.; Benini L., Temporal Variability Analysis in sEMG Hand Grasp Recognition using Temporal Convolutional Networks, in: Proceedings - 2020 IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2020, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 228 - 232 (atti di: 2020 IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2020, ita, 2020) [Contributo in Atti di convegno]
Quinones E.; Royuela S.; Scordino C.; Gai P.; Pinho L.M.; Nogueira L.; Rollo J.; Cucinotta T.; Biondi A.; Hamann A.; Ziegenbein D.; Saoud H.; Soulat R.; Forsberg B.; Benini L.; Mando G.; Rucher L., The ampere project: A model-driven development framework for highly parallel and energy-efficient computation supporting multi-criteria optimization, in: Proceedings - 2020 IEEE 23rd International Symposium on Real-Time Distributed Computing, ISORC 2020, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 201 - 206 (atti di: 23rd IEEE International Symposium on Real-Time Distributed Computing, ISORC 2020, usa, 2020) [Contributo in Atti di convegno]
Diversi R.; Bartolini A.; Benini L., Thermal Model Identification of Computing Nodes in High-Performance Computing Systems, «IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS», 2020, 67, Article number: 8863115, pp. 7778 - 7788 [articolo]Open Access
Ozsoy C.; Cossettini A.; Hager P.; Vostrikov S.; Luis Dean-Ben X.; Benini L.; Razansky D., Towards a compact, high-speed optical linkbased 3D optoacoustic imager, in: Proceedings of IEEE Sensors, Institute of Electrical and Electronics Engineers Inc., «PROCEEDINGS OF IEEE SENSORS ...», 2020, 2020-, pp. 1 - 4 (atti di: 2020 IEEE Sensors, SENSORS 2020, nld, 2020) [Contributo in Atti di convegno]
Prasad, Rohit; Das, Satyajit; Martin, Kevin J. M.; Tagliavini, Giuseppe; Coussy, Philippe; Benini, Luca; Rossi, Davide, TRANSPIRE: An energy-efficient TRANSprecision floating-point Programmable archItectuRE, in: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Institute of Electrical and Electronics Engineers Inc. (IEEE), «PROCEEDINGS DESIGN, AUTOMATION, AND TEST IN EUROPE CONFERENCE AND EXHIBITION», 2020, pp. 1067 - 1072 (atti di: 23rd Design, Automation and Test in Europe Conference and Exhibition, DATE 2020, Grenoble, France, 9-13 March 2020) [Contributo in Atti di convegno]Open Access
Cossettini A.; Brandalise D.; Palestri P.; Bertacchini A.; Ramponi M.; Widdershoven F.; Benini L.; Selmi L., Ultra-High Frequency (500 MHz) Capacitance Spectroscopy for Nanobiosensing, in: Proceedings of IEEE Sensors, Institute of Electrical and Electronics Engineers Inc., «PROCEEDINGS OF IEEE SENSORS ...», 2020, 2020-, pp. 1 - 4 (atti di: 2020 IEEE Sensors, SENSORS 2020, nld, 2020) [Contributo in Atti di convegno]
Brunelli D.; Polonelli T.; Benini L., Ultra-low energy pest detection for smart agriculture, in: Proceedings of IEEE Sensors, Institute of Electrical and Electronics Engineers Inc., «PROCEEDINGS OF IEEE SENSORS ...», 2020, 2020-, pp. 1 - 4 (atti di: 2020 IEEE Sensors, SENSORS 2020, Rotterdam, Netherlands, 2020) [Contributo in Atti di convegno]Open Access
Kartsch Victor; Artoni F.; Benatti S.; Micera S.; Benini L., Using Low-Power, Low-Cost IoT Processors in Clinical Biosignal Research: An In-depth Feasibility Check, in: Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS, Institute of Electrical and Electronics Engineers Inc., «IEEE ENGINEERING IN MEDICINE AND BIOLOGY ... ANNUAL CONFERENCE PROCEEDINGS», 2020, 2020, pp. 4008 - 4011 (atti di: 42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society, EMBC 2020, Montreal, CANADA, JUL 20-24, 2020) [Contributo in Atti di convegno]Open Access
Garofalo, Angelo; Tagliavini, Giuseppe; Conti, Francesco; Rossi, Davide; Benini, Luca, XpulpNN: Accelerating Quantized Neural Networks on RISC-V Processors Through ISA Extensions, in: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Institute of Electrical and Electronics Engineers Inc. (IEEE), 2020, pp. 186 - 191 (atti di: Design, Automation and Test in Europe Conference and Exhibition, DATE 2020, Grenoble, France, 9-13 March 2020) [Contributo in Atti di convegno]Open Access
